CS 5745 - Testing and Verification of Digital Circuits

Description
Study of failure and fault models in digital circuits, stuck-at-faults, transition faults, transistor faults, combinational/sequential circuit ATPG, FSM testing, design fault test, LFSR and BIST, equivalence checking, BDDs, BMDs, canonical representations of Boolean functions.
Credits
3
Recent Professors
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Recent Semesters
Fall 2019, Fall 2017
Offered
MW
Avg. Class Size
53
Avg. Sections
1