FOR 205 - Microscopy in FS

Description
Introduction to optical and electron microscopy. Transmission, diffraction, reflection and absorption; polarized light and polarizing crystals; phase contrast. Radiography; image recording, SEM analysis of gunshot residues, paints, glass. EDS, XRF analysis, signal-to-noise ratios, minimum detectable levels and homogeneity.
Credits
3
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Recent Semesters
Spring 2019
Offered
Tu
Avg. Class Size
20
Avg. Sections
1