Practical techniques in transmission electron microscopy (TEM): topics include microscope operation and alignment, diffraction modes and analysis, bright-field/dark-field imaging, high resolution and aberration corrected imaging, scanning TEM (STEM) imaging, x-ray energy dispersive spectrometry (EDS) and electron energy loss spectrometry (EELS) for compositional analysis and mapping. Prerequisite: 321, consent of instructor. Enrollment limited to 12. Class Notes: Weekly demo time: Mondays 12-1pm. Lab times: TBA.